Be Bayesian by attachments to catch more uncertainty

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Authors: Shiyu Shen, Bin Pan, Tianyang Shi, Tao Li, Zhenwei Shi
Cited by: 0
References: 7

Fields of Study & Subjects

Adversarial Robustness in Machine Learning Gaussian Processes and Bayesian Inference Advanced Neural Network Applications

Publication details

Journal / source
Pattern Recognition
Volume
175
Pages
113084–113084
Publication date
15 January 2026
Language
EN