OW-DLN: A novel open-world decoupled learning network for fabric defect detection
Fields of Study & Subjects
Industrial Vision Systems and Defect Detection
Advanced Neural Network Applications
Generative Adversarial Networks and Image Synthesis
Publication details
- Journal / source
- Pattern Recognition
- Publisher
- Elsevier BV
- Volume
- 175
- Pages
- 113112–113112
- Publication date
- 18 January 2026
- Language
- EN