CED: CLIP-guided entropy dynamics for robust test-time adaptation in harsh visual conditions

Pattern Recognition 2026

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Authors: Liwen Wang, Xingbo Dong, Yenlung Lai, Bin Pu, Zhao Liu, Qika Lin, Zhe Jin

DOI: 10.1016/j.patcog.2026.113297

Cited by: 1

References: 2

Fields of Study & Subjects

Advanced Vision and Imaging Generative Adversarial Networks and Image Synthesis Model Reduction and Neural Networks

References 2