SurfSyn: Domain foundation model for pixel-level surface defect detection driven by synthetic data
Fields of Study & Subjects
Advanced Neural Network Applications
Industrial Vision Systems and Defect Detection
Infrastructure Maintenance and Monitoring
Publication details
- Journal / source
- Pattern Recognition
- Publisher
- Elsevier BV
- Volume
- 179
- Pages
- 113709–113709
- Publication date
- 18 April 2026
- Language
- EN