Accurate and fast phase extraction of single spatial-carrier phase-shifting interferometry
Fields of Study & Subjects
Optical measurement and interference techniques
Digital Holography and Microscopy
Advanced X-ray Imaging Techniques
Publication details
- Journal / source
- Precision Engineering
- Publisher
- Elsevier BV
- Volume
- 99
- Pages
- 607–614
- Publication date
- 13 February 2026
- Language
- EN