Measurement uncertainty propagation in classification machine learning techniques following a Bayesian framework

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Authors: Manuel Lopez Cabrera, Wahb Zouhri, Sandra Zimmer-Chevret, Jean‐Yves Dantan
Cited by: 0
References: 15

Abstract

This paper proposes a framework to propagate and quantify the impact of measurement uncertainties following Bayesian inference on the robustness of machine learning classification accuracy. The use of machine learning techniques in metrology has increased in these last years due to the advancement in sensing technology. However, the data obtained is tainted by uncertainties. The problem emerges when measurement uncertainties may provoke a large region that datapoint could cover, resulting in misclassification. Therefore, the impact of including a priori knowledge (when is available) or Gaussian measurement uncertainties by means of probability class prediction are studied in an industrial case.

Fields of Study & Subjects

Scientific Measurement and Uncertainty Evaluation Advanced Measurement and Metrology Techniques Gaussian Processes and Bayesian Inference

Publication details

Journal / source
Procedia CIRP
Volume
138
Pages
1103–1108
Publication date
1 January 2026
Language
EN