Overview of hot-carrier and total ionizing dose degradation mechanisms in MOSFETs

Radiation Physics and Chemistry 2026

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Authors: Minghui Liu, Min Zhu, Yanru Ren, Xuehui Dai, Panhui Chen, Jingyun Zhao, Siyuan Wang

DOI: 10.1016/j.radphyschem.2026.113605

Cited by: 0

References: 62

Fields of Study & Subjects

Semiconductor materials and devices Radiation Effects in Electronics Advancements in Semiconductor Devices and Circuit Design

References 62