Copying X-ray blazed Si-gratings in Au— first results
Fields of Study & Subjects
Advanced X-ray Imaging Techniques
Thin-Film Transistor Technologies
Crystallography and Radiation Phenomena
Publication details
- Journal / source
- Radiation Physics and Chemistry
- Publisher
- Elsevier BV
- Volume
- 244
- Pages
- 113759–113759
- Publication date
- 25 February 2026
- Language
- EN