A hybrid modeling framework for predicting the multilayer ceramic capacitor reliability under thermal-electrical coupling operating conditions

Reliability Engineering & System Safety 2026

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Authors: D.J. Li, Yuguang Zhong, Xue Zhou, Guofu Zhai, Rui Kang

DOI: 10.1016/j.ress.2026.112211

Cited by: 2

References: 47

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Semiconductor materials and devices Ferroelectric and Piezoelectric Materials

References 47