Path integral solution of the Li-Chen equation and its application to global dynamic reliability via time-variant extreme process

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Authors: Meng‐Ze Lyu, Yi Luo, Shenghan Zhang, Michael Beer
Cited by: 1
References: 83

Fields of Study & Subjects

Reliability and Maintenance Optimization Probabilistic and Robust Engineering Design Statistical Distribution Estimation and Applications

Publication details

Journal / source
Reliability Engineering & System Safety
Publisher
Elsevier BV
Volume
272
Pages
112474–112474
Publication date
27 February 2026
Language
EN