Path integral solution of the Li-Chen equation and its application to global dynamic reliability via time-variant extreme process
Fields of Study & Subjects
Reliability and Maintenance Optimization
Probabilistic and Robust Engineering Design
Statistical Distribution Estimation and Applications
Publication details
- Journal / source
- Reliability Engineering & System Safety
- Publisher
- Elsevier BV
- Volume
- 272
- Pages
- 112474–112474
- Publication date
- 27 February 2026
- Language
- EN