Electrical performance degradation analysis of parallel modules considering the coupling environmental effect

Reliability Engineering & System Safety 2026

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Authors: Siyang Dai, Na Li, Deshun Cao, Xiangqian Zhang, Chi-Min Shu, Bing Sun

DOI: 10.1016/j.ress.2026.112498

Cited by: 0

References: 37

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Electrical Contact Performance and Analysis Multilevel Inverters and Converters

References 37