Performance degradation analysis and reliability modeling of HEPA filters based on the flow rate-purification time decay mechanism

Reliability Engineering & System Safety 2026

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Authors: Wenhao Luo, Shangbin Long, Zheng Liu, Xiaoting Zhu

DOI: 10.1016/j.ress.2026.112799

Cited by: 1

References: 43

Fields of Study & Subjects

Semiconductor materials and devices High voltage insulation and dielectric phenomena Digital Filter Design and Implementation

References 43