Structural, optical, and dielectric properties of (x)BaTiO3-(1-x)BaZr0.5Ti0.5O3 thin films with tantalum and mangosteen leaf extract doping

The synthesis of the thin films (x)BaTiO3-(1-x)BaZr0.5Ti0.5O3 with x = 0.3, 0.4, and 0.5, doped with tantalum and mangosteen leaf extract (0.5 mol%), was performed using the sol-gel method on fluorine-doped tin oxide (FTO) substrates. One of the advantages of these thin films is that they are easily modified and have permanent properties. The characterization methods used in this study include X-ray diffraction (XRD), ultraviolet-visible (UV-Vis) spectroscopy, field emission scanning electron microscopy (FESEM), and impedance spectroscopy. The XRD diffraction peaks for the compositions x = 0.4 and 0.5 indicate that the samples have a tetragonal structure with crystal sizes of 25.75 nm and 25.82 nm, respectively, while the composition x = 0.3 exhibits an amorphous structure. The energy bandgap of the samples increases with the increase in composition, measuring 3.99 eV, 4.01 eV, and 4.06 eV. The particle sizes of the thin films are 168.98 ± 47.56 nm, 205.85 ± 52.24 nm, and 256.17 ± 58.01 nm, respectively. The thickness of the thin films increases with the increasing composition of x, measuring 77.5 nm, 160.1 nm, and 442.4 nm. The morphology of the samples was analyzed at a magnification of 50,000x, showing particle sizes of 124.53 ± 43.15 nm, 131.67 ± 42.23 nm, and 159.89 ± 46.16 nm. EDX analysis shows that Ba is the predominant element, with 7 peaks in each sample. Zr has 4 peaks in each sample, while Ti has 3 peaks in each sample. Additionally, the element O shows one peak. The capacitance values at a frequency of 10 kHz are 143 F, 455 F, and 650 F, respectively. The dielectric constant values at a frequency of 10 kHz are 203, 207, and 215, respectively. The dielectric loss values at a frequency of 10 kHz are 0.03, 0.04, and 0.05, respectively.