Advanced elemental concentration correction in X-ray imaging using multi-segment silicon Drift detectors: Application to micro-Particle Induced X-ray Emission (PIXE)

Spectrochimica Acta Part B Atomic Spectroscopy 2026

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Authors: Ebrahim Gholami Hatam, Primož Pelicon

DOI: 10.1016/j.sab.2026.107477

Cited by: 0

References: 22

Fields of Study & Subjects

Electron and X-Ray Spectroscopy Techniques X-ray Spectroscopy and Fluorescence Analysis Ion-surface interactions and analysis

References 22