First application of total-reflection X-ray fluorescence (TXRF) spectrometry to the determination of Sr, Ba and rare earth elements in fluorite
Fields of Study & Subjects
X-ray Spectroscopy and Fluorescence Analysis
Laser-induced spectroscopy and plasma
SAS software applications and methods
Publication details
- Journal / source
- Spectrochimica Acta Part B Atomic Spectroscopy
- Publisher
- Elsevier BV
- Volume
- 242
- Pages
- 107542–107542
- Publication date
- 30 April 2026
- Language
- EN