Anisotropic phase transformation of Cu6Sn5 driven by electromigration in lead-free solder joints
Fields of Study & Subjects
Electronic Packaging and Soldering Technologies
Copper Interconnects and Reliability
3D IC and TSV technologies
Publication details
- Journal / source
- Scripta Materialia
- Publisher
- Elsevier BV
- Volume
- 275
- Pages
- 117154–117154
- Publication date
- 8 January 2026
- Language
- EN