A novel MEMS device for quantitative in-situ tension-compression electromechanical testing of nanomaterials

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Authors: Yuheng Huang, Meile Wu, Chengyu Gao, Yang Zong, Lei Wen, Bozhi Wu, Hailong Zhang
Cited by: 1
References: 55

Fields of Study & Subjects

Force Microscopy Techniques and Applications Mechanical and Optical Resonators Advanced MEMS and NEMS Technologies

Publication details

Journal / source
Sensors and Actuators A Physical
Publisher
Elsevier BV
Volume
409
Pages
118126–118126
Publication date
16 June 2026
Language
EN