Short-term charge trapping effects in ferroelectric FETs: impact of pulse amplitude and timing

Solid-State Electronics 2026

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Authors: Dominik Martin Kleimaier, Stefan Dünkel, Halid Mulaosmanovic, Johannes Müller, Sven Beyer, Viktor Havel, Thomas Mikolajick
DOI: 10.1016/j.sse.2026.109332
Cited by: 0
References: 14

Fields of Study & Subjects

Ferroelectric and Negative Capacitance Devices Semiconductor materials and devices Ferroelectric and Piezoelectric Materials

Publication details

Journal / source
Solid-State Electronics
Volume
233
Pages
109332–109332
Publication date
11 January 2026
Language
EN