Characteristics analysis of ESD protection devices based on DSOI technology under elevated temperatures

Solid-State Electronics 2026

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Authors: Dinghan Ye, Cheng Zhang, Fanyu Liu, Liwan Yue, Yang Huang, JuanJuan Wang, Bo Li
DOI: 10.1016/j.sse.2026.109353
Cited by: 0
References: 12

Fields of Study & Subjects

Electrostatic Discharge in Electronics Silicon Carbide Semiconductor Technologies Integrated Circuits and Semiconductor Failure Analysis

Publication details

Journal / source
Solid-State Electronics
Volume
234
Pages
109353–109353
Publication date
1 March 2026
Language
EN