Positive Bias Temperature Instability (PBTI) in n- and p-channel polysilicon thin-film transistors (TFTs) for high-voltage applications

Solid-State Electronics 2026 Open access

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Authors: B. Kaczer, Seyed Mojtaba Sadati Faramarzi, Luca Panarella, François Berghmans, Jacopo Franco, Tibor Grasser, Yannick Baines, Florian De Roose, Nikolas P. Papadopoulos, Raf Appeltans
DOI: 10.1016/j.sse.2026.109384
Cited by: 0
References: 20

Fields of Study & Subjects

Semiconductor materials and devices Thin-Film Transistor Technologies Advancements in Semiconductor Devices and Circuit Design

Publication details

Journal / source
Solid-State Electronics
Volume
236
Pages
109384–109384
Publication date
5 June 2026
Language
EN