Charge transport mechanism, dielectric relaxation, and impedance spectroscopy of an Au/TCPP/n-Si/Al diode

Surfaces and Interfaces 2026

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Authors: Naglaa AbdelAll, Yasser A. M. Ismail, Sahar Elnobi, Ghada A. Khouqeer, Tetsuo Soga, Amr Attia Abuelwafa

DOI: 10.1016/j.surfin.2026.109368

Cited by: 1

References: 72

Fields of Study & Subjects

Semiconductor materials and interfaces Copper Interconnects and Reliability Silicon and Solar Cell Technologies

References 72