Investigation of etch front morphology evolution for high-aspect-ratio deep silicon etching by uniform metal-assisted Chemical Etching
Fields of Study & Subjects
Nanowire Synthesis and Applications
Plasma Diagnostics and Applications
Advanced MEMS and NEMS Technologies
Publication details
- Journal / source
- Surfaces and Interfaces
- Publisher
- Elsevier BV
- Volume
- 93
- Pages
- 109425–109425
- Publication date
- 26 April 2026
- Language
- EN