Fine-grained sensitive node hardening for graph convolutional network systems

View at publisher
Authors: Jing Zhang, Mingzhang Duan, Peiyu Li, Lei Shen, Chang Cai
Cited by: 0
References: 20

Fields of Study & Subjects

Radiation Effects in Electronics Physical Unclonable Functions (PUFs) and Hardware Security VLSI and Analog Circuit Testing

Publication details

Journal / source
Journal of Systems Architecture
Volume
175
Pages
103737–103737
Publication date
11 February 2026
Language
EN