Establishment of the damage tolerance criterion of projectile-borne electronics in the high-g extreme environment

• Damage Tolerance Criterion (DTC) established for overload damage evaluation • High amplitude narrow pulses affect tolerance sharply while wide pulses stabilize it • Impulse-equivalence framework enables damage assessment for arbitrary shock pulses Projectile-borne electronics are essential components for precision-guided munitions. However, they are subjected to a complex overload environment characterized by high-frequency vibrations, high temperatures, and high pressures during launch. Evaluating overload damage presents a significant challenge. Consequently, this study aims to establish a damage tolerance criterion for projectile-borne electronics in high-g extreme environments using impact overload tests and high-precision numerical simulations. Initially, an impact overload test device was designed and implemented, considering the guidance segment and chamber firing characteristics, to ascertain the overload damage characteristics of projectile-borne electronics. Subsequently, a simulation model incorporating projectile-borne electronics was established and validated to identify the most vulnerable regions and critical overload responses under various conditions. Based on the simulation data, the overload damage tolerance curve was established using a power function regression fitting method. Leveraging the concept of impulse equivalence, the damage tolerance criterion for the high-g extreme environment was formulated. The criterion’s accuracy and practicality were further verified through experimental damage results of electronic components. This study provides a practical design foundation for the anti-high-overload design of projectile-borne electronics.