STEM-EELS study of beam damage in polymers and extra-terrestrial organic matter using direct electron detectors

Ultramicroscopy 2026

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Authors: Sylvain Laforet, Corentin Le Guillou, Adrien Teurtrie, Maya Marinova, Francisco de la Peña, Anne-Marie Blanchenet, Sylvain Bernard, Hugues Leroux
DOI: 10.1016/j.ultramic.2026.114309
Cited by: 0
References: 61

Fields of Study & Subjects

X-ray Spectroscopy and Fluorescence Analysis Polymer Nanocomposite Synthesis and Irradiation Astrophysical Phenomena and Observations

Publication details

Journal / source
Ultramicroscopy
Volume
282
Pages
114309–114309
Publication date
3 January 2026
Language
EN