A universal FIB approach for contamination- and damage-free plan-view TEM lamellae using NaCl sacrificial layers

Ultramicroscopy 2026

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Authors: Chen Liu, Jingkai Xu, Qingxiao Wang, Tianchao Guo, Maolin Chen, Dongxing Zheng, Husam N. Alshareef, Xixiang Zhang

DOI: 10.1016/j.ultramic.2026.114319

Cited by: 1

References: 22

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Electrocatalysts for Energy Conversion Electron and X-Ray Spectroscopy Techniques

References 22