Drift correction methods for multi-pass 4D-STEM

Ultramicroscopy 2026

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Authors: Ali Mostaed, Chen Huang, Amirafshar Moshtaghpour, Emanuela Liberti, Mohammed Yusuf, Judy S. Kim, Angus I. Kirkland
DOI: 10.1016/j.ultramic.2026.114329
Cited by: 2
References: 25

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Advanced X-ray Imaging Techniques Crystallography and Radiation Phenomena

Publication details

Journal / source
Ultramicroscopy
Publisher
Elsevier BV
Volume
282
Pages
114329–114329
Publication date
6 February 2026
Language
EN