Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse data

Ultramicroscopy 2026

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Authors: Bowen Liu, Zheng Hu, Walter van Bodegom, Dmitry Byelov, Tianshui Yang, Yi Wang

DOI: 10.1016/j.ultramic.2026.114333

Cited by: 1

References: 48

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Machine Learning in Materials Science Advanced Materials Characterization Techniques

References 48