Deep learning approaches for dislocation segmentation in TEM

Ultramicroscopy 2026 Open access

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Authors: Assya Boughrara, Christine Viala, L. Dupuy, F. Mompiou

DOI: 10.1016/j.ultramic.2026.114334

Cited by: 0

References: 18

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Advanced Neural Network Applications Advanced Materials Characterization Techniques

References 18