A knowledge-guided, drift-aware computer vision pipeline for automated nanoscale atomic force microscope surface characterization

Ultramicroscopy 2026

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Authors: T. Karakoyun Barandır, Derya Gemici Deveci, Ö. Ünverdi, C. Çelebi
DOI: 10.1016/j.ultramic.2026.114401
Cited by: 1
References: 31

Fields of Study & Subjects

Force Microscopy Techniques and Applications Piezoelectric Actuators and Control Advanced MEMS and NEMS Technologies

Publication details

Journal / source
Ultramicroscopy
Publisher
Elsevier BV
Volume
285
Pages
114401–114401
Publication date
8 June 2026
Language
EN