Atomic-scale measurements with custom-built scanning tunneling microscopes in specialized environments

Ultramicroscopy 2026

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Authors: Behnam Esmaeilzadeh, Muhammad Touqeer, Sihao Li, Xianglong Wu, Xue Zhang
DOI: 10.1016/j.ultramic.2026.114406
Cited by: 1
References: 115

Fields of Study & Subjects

Force Microscopy Techniques and Applications Advanced Electron Microscopy Techniques and Applications Advanced Materials Characterization Techniques

Publication details

Journal / source
Ultramicroscopy
Publisher
Elsevier BV
Volume
285
Pages
114406–114406
Publication date
15 June 2026
Language
EN