Degradation behavior of vertical gallium nitride light-emitting diodes in salt spray environments: A study based on electrical and material analysis techniques, integrated with a smart protection circuit application perspective
Fields of Study & Subjects
GaN-based semiconductor devices and materials
Silicon Carbide Semiconductor Technologies
Integrated Circuits and Semiconductor Failure Analysis
Publication details
- Journal / source
- Vacuum
- Volume
- 246
- Pages
- 115090–115090
- Publication date
- 13 January 2026
- Language
- EN