Microstructure, sputtering performance, and film properties of Ag-1wt.%Cu alloy targets: A comparative study with pure Ag
Fields of Study & Subjects
Copper Interconnects and Reliability
Microstructure and mechanical properties
Copper-based nanomaterials and applications
Publication details
- Journal / source
- Vacuum
- Publisher
- Elsevier BV
- Volume
- 248
- Pages
- 115216–115216
- Publication date
- 25 February 2026
- Language
- EN