Detector-induced distortions in low-energy ion scattering: Energy and material dependence from binary collision approximation simulations
Fields of Study & Subjects
X-ray Spectroscopy and Fluorescence Analysis
Electron and X-Ray Spectroscopy Techniques
Advanced X-ray and CT Imaging
Publication details
- Journal / source
- Vacuum
- Publisher
- Elsevier BV
- Volume
- 254
- Pages
- 115665–115665
- Publication date
- 17 July 2026
- Language
- EN