A test data compression method based on sliding-window encoding and matching length reuse

Integration 2026

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Authors: Yuanfa Ji, Haihui Zhang, Xiyan Sun, Furong Jiang, Qiang Fu

DOI: 10.1016/j.vlsi.2026.102663

Cited by: 1

References: 29

Fields of Study & Subjects

VLSI and Analog Circuit Testing Advancements in PLL and VCO Technologies Low-power high-performance VLSI design

References 29