Ring oscillator-based on-chip aging sensor for recycled IC detection
Fields of Study & Subjects
Physical Unclonable Functions (PUFs) and Hardware Security
VLSI and Analog Circuit Testing
Radiation Effects in Electronics
Publication details
- Journal / source
- Integration
- Volume
- 108
- Pages
- 102677–102677
- Publication date
- 8 February 2026
- Language
- EN