Design and Noise-Aware Validation of a Testable Dual-Edge Triggered Reversible D Flip-Flop Using IBM Quantum Qiskit Simulation

Integration 2026

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Authors: Neeraj Kumar Misra, Nirupma Pathak, Seyed Sajad Ahmadpour, Murugaperumal Krishnamoorthy, Mojtaba Noorallahzadeh, Mrinal Goswami, Bandan Kumar Bhoi, Sambit Satpathy
DOI: 10.1016/j.vlsi.2026.102689
Cited by: 2
References: 27

Fields of Study & Subjects

Radiation Effects in Electronics VLSI and Analog Circuit Testing Integrated Circuits and Semiconductor Failure Analysis

Publication details

Journal / source
Integration
Publisher
Elsevier BV
Volume
109
Pages
102689–102689
Publication date
24 February 2026
Language
EN