YOLO-CMDS: An enhanced method for PCB defect detection

Integration 2026

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Authors: Junpeng Xu, Lei Shi, Wenqiang Yang, Xiangbo Zhu, Jin Li, Yu Wang

DOI: 10.1016/j.vlsi.2026.102732

Cited by: 2

References: 30

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection VLSI and Analog Circuit Testing Biosensors and Analytical Detection

References 30