Double-node upset and half select issue tolerant split-14T SRAM for avionics applications

Integration 2026

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Authors: Debabrata Mondal, Syed Farah Naz, Ambika Prasad Shah

DOI: 10.1016/j.vlsi.2026.102737

Cited by: 1

References: 13

Fields of Study & Subjects

Radiation Effects in Electronics VLSI and Analog Circuit Testing Low-power high-performance VLSI design

References 13