Cost-aware test pattern ordering for VLSI using an enhanced LSTNet architecture

Integration 2026

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Authors: Bintao Geng, Ying Sun, Tai Gil Song, Yadong Li

DOI: 10.1016/j.vlsi.2026.102741

Cited by: 1

References: 16

Fields of Study & Subjects

VLSI and Analog Circuit Testing Engineering and Test Systems Embedded Systems Design Techniques

References 16