Mitigating half-select disturb in an 11T SRAM cell using a single bitline for high stability and low power consumption

Integration 2026

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Authors: Sheshmani Yadav, Sonal Singh, Sumit Kale

DOI: 10.1016/j.vlsi.2026.102848

Cited by: 1

References: 25

Fields of Study & Subjects

Low-power high-performance VLSI design VLSI and Analog Circuit Testing Radiation Effects in Electronics

References 25