Forward/Inverse problem modeling for defect detection based on Coplanar Capacitance Scanning Imaging technology

Mechanical Systems and Signal Processing 2026

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Authors: Zeyu Xia, Yuyan Zhang, Shijin Shang, Yuan Huang, Yintang Wen, Zhao Pan, Weishuai Kong

DOI: 10.1016/j.ymssp.2025.113833

Cited by: 3

References: 36

Fields of Study & Subjects

Electrical and Bioimpedance Tomography Electrical Fault Detection and Protection Microwave Imaging and Scattering Analysis

References 36