Attention-enhanced transformer with prototype alignment for few-shot fault diagnosis under noisy cross-condition

Mechanical Systems and Signal Processing 2026

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Authors: Jie Zhang, Yuqing Chang, Fuli Wang

DOI: 10.1016/j.ymssp.2026.114256

Cited by: 3

References: 30

Fields of Study & Subjects

VLSI and Analog Circuit Testing Machine Fault Diagnosis Techniques Engineering and Test Systems

References 30