Physics informed terahertz multi-label dual adversarial network for intelligent identification of composite overlapping defects under variable testing conditions

Mechanical Systems and Signal Processing 2026

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Authors: Yafei Xu, Peihan Li, Xin He, Yuqing Cui, Xiyuan Peng, Datong Liu, Liuyang Zhang

DOI: 10.1016/j.ymssp.2026.114597

Cited by: 1

References: 36

Fields of Study & Subjects

Terahertz technology and applications Wireless Signal Modulation Classification Thermography and Photoacoustic Techniques

References 36