MSEEN-LightGBM via IDTCWPT for noise-robust fault diagnosis of industrial equipment

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Authors: Hongyan Dui, Hengbo Wang, Huanqi Zhang, Xiang Li
Cited by: 1
References: 38

Fields of Study & Subjects

Fault Detection and Control Systems Machine Fault Diagnosis Techniques VLSI and Analog Circuit Testing

Publication details

Journal / source
Mechanical Systems and Signal Processing
Publisher
Elsevier BV
Volume
259
Pages
114837–114837
Publication date
12 August 2026
Language
EN