Thickness-Dependent Electronic and Transport Properties of PtSe 2 on Au(111)

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Authors: R. H. Miwa, Danilo P. Kuritza, José E. Padilha, Rafael L. H. Freire, F. Crasto de Lima, A. Fazzio
Cited by: 1
References: 50

Abstract

High Resolution Image Download MS PowerPoint Slide Among two-dimensional materials, platinum diselenide (PtSe 2 ) has attracted interest for applications in electronic devices such as transistors and sensors, mainly due to the thickness dependence of its bandgap. Thus, understanding electronic confinement and transport properties in contact with metals is essential for device design. Here, using density functional theory, we investigated the structural, electronic, and electronic transport properties of monolayer (ML), bilayer (BL), and trilayer (TL) PtSe 2 on Au(111), PtSe 2 -X/Au (X = ML, BL, TL). We find the emergence of a chemical interaction at the interface, leading to (i) ohmic contact, (ii) hole doping of PtSe 2, and (iii) metallization of the contact layer. In PtSe 2 -ML/Au, the semiconductor ML becomes metallic, while in PtSe 2 –BL/Au and PtSe 2 -TL/Au, the top layers, which do not directly contact Au, become semimetallic. Transport calculations further reveal a thickness-dependent behavior of the electronic transmittance and Schottky barriers along the PtSe 2 -X channels in contact with the PtSe 2 -X/Au(111) leads. Based on this atomistic understanding, we propose a heterostructure, Au/PtSe 2 -TL/Au, where a metal–semiconductor transition can be tuned by mechanical strain. These results highlight the potential of few-layer PtSe 2 for two-dimensional electronic devices.

Fields of Study & Subjects

2D Materials and Applications Topological Materials and Phenomena Graphene research and applications

Publication details

Journal / source
The Journal of Physical Chemistry C
Publisher
American Chemical Society (ACS)
Volume
130
Issue
17
Pages
6286–6294
Publication date
16 April 2026
Language
EN