Asymmetry-Aware Compact Modeling of Ferroelectric Devices for Circuit-Level Simulation

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Authors: Joonhyeok Lee, Joonhan Kim, Minseop Kim, H. J. Kim, Changho Ra, Hwan-Wook Choi, Jongwook Jeon
Cited by: 1
References: 33

Abstract

This paper presents a unified compact model that comprehensively captures nonideal behaviors─such as asymmetric hysteresis and minor loops─of ferroelectric devices based on hafnium–zirconium oxide (HfO 2 –ZrO 2, HZO). The proposed model, based on the Preisach framework, integrates branch-dependent slopes, asymmetric coercive voltages, imprint-induced loop shifts, and low-voltage minor-loop responses into a unified analytical form. Implemented in Verilog-A, the proposed model reproduces measured polarization–voltage ( P – V ) characteristics of a ferroelectric capacitor (FeCAP) with higher accuracy than conventional symmetric models. Furthermore, using an identical parameter set, it consistently scales from a single device to logic, memory, and neuromorphic circuits, enabling prediction of operating characteristics and read/write margins. Owing to these capabilities, the model serves as a reliable predictive tool for circuit-level design and provides a practical pathway for process–design feedback and co-optimization.

Fields of Study & Subjects

Ferroelectric and Negative Capacitance Devices Advancements in Semiconductor Devices and Circuit Design VLSI and Analog Circuit Testing

Publication details

Journal / source
ACS Applied Electronic Materials
Publisher
American Chemical Society (ACS)
Volume
8
Issue
4
Pages
1614–1625
Publication date
11 February 2026
Language
EN