High-Entropy Ti 4+ -Containing Perovskite Ceramics with Excellent Electromagnetic Wave-Absorbing Performance via Low-Temperature Sintering

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Authors: Yujie Hu, Yurong Chi, Zhengyan Zhu, Pulin Li, M. M. Li, Gang Shao, Hongliang Xu, Hao Wang, Hongxia Lu
Cited by: 1
References: 53

Abstract

To prepare absorbing materials with strong reflection loss under lower-temperature conditions, multiple elements were introduced into SrFeO 3 – x based on the design of high-entropy components. The results showed that the absorbing material Sr(Cr 1/5 Mn 1/5 Fe 1/5 Co 1/5 Ti 1/5 )O 3– x with strong reflection loss could be obtained by the solid-phase method at 1000 °C after Ti 4+ was introduced into the B site. It is worth noting that at 1100 °C, the minimum reflection loss (RL min ) of the high-entropy ceramic is −43.43 dB, and the effective absorption bandwidth (EAB) is 5.04 GHz. At 1200–1300 °C, the RL min values of high-entropy ceramics at 4.60 and 5.00 mm are −50.26 and −53.09 dB, respectively. Ti 4+ plays a dual role as a “structural stabilizer” and “electromagnetic property regulator” in high-entropy ceramic absorbing materials. Its high diffusion coefficient realizes low-temperature sintering of materials, and its multiscale effect (lattice distortion and heterogeneous interface) leads to “strong wave-absorbing capacity”. The excellent wave-absorbing performance is also attributed to the lattice distortion and large interface structure. Meanwhile, the design of Ti 4+ and other B-site high-entropy elements to construct a magnetic–dielectric cooperative mechanism and oxygen vacancy defect engineering are both key to achieving excellent performance. In addition, high-entropy ceramics containing Ti 4+ have high stability, which extends the service life of the material and provides a greater space for practical applications of absorbing materials.

Fields of Study & Subjects

Electromagnetic wave absorption materials Microwave Dielectric Ceramics Synthesis Magnetic Properties and Synthesis of Ferrites

Publication details

Journal / source
ACS Applied Electronic Materials
Publisher
American Chemical Society (ACS)
Volume
8
Issue
4
Pages
1918–1930
Publication date
12 February 2026
Language
EN