Reliable WSe 2 Memristors Enabled by van der Waals Electrode Integration for Advanced Reservoir Computing and Nociceptive Receptors

Yujie Bai; Yuhao Kong; Siling Liu; Mouyuan Liu; Shiyu Chen; Huifang Ma; Xidong Duan; Weiyou Yang; Jianhong Yang; Xingan Jiang; Yang Xiang-Dong

doi:10.1021/acsami.6c01554

Reliable WSe 2 Memristors Enabled by van der Waals Electrode Integration for Advanced Reservoir Computing and Nociceptive Receptors

ACS Applied Materials & Interfaces 2026

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Authors: Yujie Bai, Yuhao Kong, Siling Liu, Mouyuan Liu, Shiyu Chen, Huifang Ma, Xidong Duan, Weiyou Yang, Jianhong Yang, Xingan Jiang, Yang Xiang-Dong

DOI: 10.1021/acsami.6c01554

Cited by: 2

References: 61

Abstract

cycles. Beyond emulating fundamental synaptic behaviors, the devices achieve high-fidelity recognition accuracies of 99.51% for the Modified National Institute of Standards and Technology (MNIST) and 95.39% for the Fashion-MNIST data sets, respectively. Furthermore, biorealistic nociceptive functionalities, such as threshold firing and sensitization, are successfully emulated. This work demonstrates that vdW electrode integration is a robust paradigm for enhancing the reliability of 2D memristors, paving the way for robust high-performance neuromorphic intelligence hardware.

Fields of Study & Subjects

Advanced Memory and Neural Computing Neural Networks and Reservoir Computing 2D Materials and Applications

Publication details

Journal / source: ACS Applied Materials & Interfaces
Publisher: American Chemical Society (ACS)
Volume: 18
Issue: 15
Pages: 22140–22150
Publication date: 8 April 2026
Language: EN

References 61