Moiré-Induced Electronic Reconstruction in van der Waals Heterobilayer PtSe 2 /PtTe 2

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Authors: Yin-Song Liao, Ruei-Yu Wang, Han-Wei Tsai, Guan-Hao Chen, Hsin-Hsien Chan, Hsun-Ting Hsieh, Cheng-Maw Cheng, Chun-Liang Lin, Meng-Kai Lin, Jyh-Pin Chou
Cited by: 1
References: 35

Abstract

High Resolution Image Download MS PowerPoint Slide van der Waals heterostructures composed of a few atomic layers have attracted significant attention in the condensed matter physics community. Although interlayer bonding is weak, effects such as moiré modulation, charge redistribution, and electronic hybridization can substantially modify the band structure and interlayer coupling. In this work, we investigate heterostructures composed of few-layer PtSe 2 and PtTe 2 by using first-principles calculations implemented within density functional theory (DFT) and angle-resolved photoemission spectroscopy (ARPES). While both materials are Dirac semimetals in the bulk form, they undergo a transition to semiconducting states in the few-layer limit. These heterostructures allow systematic examination of how dimensional confinement and interfacial interactions influence band structure and interlayer coupling. Our combined ARPES measurements and DFT calculations indicate the presence of electronic hybridization at the interface. The interlayer coupling in PtSe 2 /PtTe 2 is associated with flat-band features and valence-band splitting induced by both inversion symmetry breaking and spin–orbit coupling. Furthermore, the local density of states indicates metallic behavior at the MM site while it remains semiconducting at MX and XX sites with the band gap of 0.40 and 0.25 eV, respectively. Further analysis shows that the electronic hybridization and charge transfer between PtSe 2 and PtTe 2 are sensitive to the interlayer distance, which is consistent with moiré characteristics. These results highlight how interfacial interactions govern the electronic properties of vdW heterostructures.

Fields of Study & Subjects

2D Materials and Applications Topological Materials and Phenomena Graphene research and applications

Publication details

Journal / source
ACS Nano
Publisher
American Chemical Society (ACS)
Volume
20
Issue
6
Pages
5102–5109
Publication date
2 February 2026
Language
EN